Mapping Quantitative Trait Loci for Resistance to Verticillium Wilt (Verticillium Dahliae) Using a Recombinant Inbred Line Population

Cotton is one of the most important cash crops in the world and is the leading natural fiber crop worldwide. Verticillium wilt is one of the most devastating diseases in cotton causing severe yield and quality loss. Utilization of resistant cultivars is often considered the most cost-effective method to control the disease. However, the lack of effective resistant germplasm and inadequate knowledge of relevant genetic mechanisms have been the major challenges for breeding resistant cultivars. In this study, a recombinant inbred line (RIL) population with 96 lines from a resistant genotype, NM 24016 and a susceptible genotype TM-1 was used to map quantitative trait loci (QTLs) against Verticillium wilt. Verticillium wilt resistance was evaluated in the greenhouse using an artificial inoculation method and the screening is being repeated. Based on a total of 492 microsatellite (SSR) loci and a linkage map, QTLs against Verticillium wilt will be assigned to different chromosomes and DNA markers linked to these resistance QTLs will be determined.