Methodology for Developing a Crop Yield Stability Map for a Field

This presentation will describe the methodology used to develop a yield stability map for a field. We propose that there exist yield stability patterns for commercial field crop production which the growers can use to optimize crop production while minimizing inputs. This methodology uses multiple years of crop yield monitor maps and a high resolution, high density LIDAR digital elevation map of the field together with GIS and image processing and SAS statistical analysis to produce a detailed, multiple component GIS map which shows transitions from low yielding areas through medium yielding areas to the most productive high yielding areas of the field. Further analysis details result in a statistically sound three component map showing low-, medium- and high-yield zones in the field.