Thursday, January 4, 2018: 8:35 AM-9:20 AM

Salon I (Marriott Rivercenter Hotel)

Presiding:

Ramesh Buyyarapu

Organizers:

B. Todd Campbell and Ramesh Buyyarapu

8:35 AM

Host Plant Resistance Traits of Phytogen Varieties
Mustafa McPherson, PhytoGen Seed Company; Joel Mahill, PhytoGen Seed Company; Dru Rush, PhytoGen Seed Company; Ramesh Buyyarapu, Corteva Agriscience

Audio File

8:50 AM

Use of Molecular Markers to Identify Potential New Sources of Root-Knot Nematode Resistance in Upland Cotton
Martin J. Wubben, USDA-ARS; Jack C. McCarty, USDA-ARS; Franklin E. Callahan, USDA-ARS; Dewayne D. Deng, USDA-ARS; Johnie N. Jenkins, USDA-ARS

Audio File Recorded Presentation

9:05 AM

Differential Responses to Various Stress Conditions in Upland Cotton Near Isogenic Lines Differing in Fiber Maturity
Hee Jin Kim, USDA-ARS, Southern Regional Research Center; Harish Ratnayaka, Xavier University of Louisiana; Jay E. Mellon, USDA-ARS, SRRC

See more of: Cotton Improvement Conference

Cotton Improvement Oral Session I - General